Low-temperature activation of mg-doped GaN using Ni films

被引:37
|
作者
Waki, I
Fujioka, H
Oshima, M
Miki, H
Fukizawa, A
机构
[1] Univ Tokyo, Dept Appl Chem, Bunkyo Ku, Tokyo 1138656, Japan
[2] Showa Denko KK, Cent Res Lab, Chichibu Res Lab, Chichibu, Saitama 3691871, Japan
关键词
D O I
10.1063/1.1371537
中图分类号
O59 [应用物理学];
学科分类号
摘要
The activation of metalorganic chemical vapor deposition-grown Mg-doped GaN by N-2 annealing with a thin Ni film has been investigated. p-type conduction in GaN has been obtained at an annealing temperature as low as 200 degreesC using the proposed technique. A hole concentration of 2 x 10(17) cm(-3) has been achieved by the annealing at 400 degreesC. Secondary ion mass spectroscopy measurements have revealed that hydrogen is effectively removed from the Mg-doped GaN layer. These results suggest that the Ni film significantly enhances hydrogen desorption from the GaN film, which results in the activation of Mg-doped GaN at quite low temperatures. (C) 2001 American Institute of Physics.
引用
收藏
页码:2899 / 2901
页数:3
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