Field Emission Properties and Reliability of ZnO Nanorod, Nanopagoda, and Nanotip Current Emitters

被引：12
|
作者：
Yao, I. -Chuan [1 ]
Lin, Pang [1 ]
Tseng, Tseung-Yuen [2 ,3 ]
机构：
[1] Natl Chiao Tung Univ, Dept Mat Sci & Engn, Hsinchu 300, Taiwan
[2] Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu 300, Taiwan
[3] Natl Chiao Tung Univ, Inst Elect, Hsinchu 300, Taiwan
来源：
IEEE TRANSACTIONS ON NANOTECHNOLOGY | 2012年 / 11卷 / 04期
关键词：
Field emission properties; ZnO nanorod; nanopagoda; nanotip; oxygen plasma treatment; reliability; GROWTH; ARRAYS;
D O I：
10.1109/TNANO.2012.2195502
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Fabrication, optical, and field emission properties of ZnO nanorod, nanopagoda, and nanotip emitters were studied. The ZnO nanotip emitters are prepared by using combination of solution method and oxygen plasma treatment. All the emitters exhibit a highly c-axis preferred orientation crystalline structure. The nanopagoda and nanotip emitters have turn-on fields of 1.43 and 1.07 V/mu m, respectively, under 1 mu A/cm(2) and field enhancement factors of 3681 and 4735 at 25 degrees C, respectively. The nanotip emitters with tip angle of 20 degrees and number density of 10 emitters/mu m(2) have very stable emission at 25 degrees C over 2 x 10(4) s and successive operation between the 25 degrees C and 100 degrees C over 5000 s. Our finding provides an effective route for practical applications in flat panel display and light-emitting device in the future.
引用
收藏
页码：746 / 750
页数：5
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