Simple ultraviolet-based soft-lithography process for fabrication of low-loss polymer polysiloxanes-based waveguides

被引:2
|
作者
Teng, J. [1 ]
Yan, H. [1 ]
Li, L. [1 ]
Zhao, M. [2 ]
Zhang, H. [3 ]
Morthier, G. [4 ]
机构
[1] Henan Univ Sci & Technol, Sch Phys & Engn, Luoyang 471003, Peoples R China
[2] Dalian Univ Technol, Sch Phys & Optoelect Technol, Dalian 116023, Peoples R China
[3] Dalian Univ Technol, Dept Polymer Sci & Mat, Dalian 116023, Peoples R China
[4] Univ Ghent, INTEC Dept, IMEC, Photon Res Grp, B-9000 Ghent, Belgium
关键词
MICRORING RESONATORS;
D O I
10.1049/iet-opt.2010.0110
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A simple ultraviolet (UV)-based soft-lithography process is used for fabrication of polymer polysiloxanes (PSQ-L) waveguides. The imprint process is first done on the cladding PSQ-LL layer and is followed by a spin-coating step to fill the imprinted features with core PSQ-LH layer material. The optical loss of the straight PSQ-L waveguides is characterised by the Fabry-Perot method for the first time. Even with non-polished facet of the waveguide, the Fabry-Perot resonance spectrum is obtained. An upper limit scattering loss of the waveguide is extracted to be less than 0.8 +/- 0.2 dB/cm for TE mode and 1.3 +/- 0.2 dB/cm for TM mode at 1550 nm. The fully transferred pattern and low scattering loss proves it to be an effective way to replicate low-loss polymer PSQ-L-based waveguides.
引用
收藏
页码:265 / 269
页数:5
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