Application of the method of subregions to measurement of layered materials

被引：0
|
作者：
Perry, Bradley [1 ]
Cossmann, Steven [1 ]
Kempel, Leo [1 ]
Rothwell, Edward [1 ]
机构：
[1] Michigan State Univ, Dept Elect & Comp Engn, E Lansing, MI 48824 USA
来源：
ULTRA-WIDEBAND, SHORT-PULSE ELECTROMAGNETICS 8 | 2007年
关键词：
D O I：
10.1007/978-0-387-73046-2_28
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：211 / 218
页数：8
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