Light-Induced Degradation Mechanism in Poly(3-hexylthiophene)/Fullerene Blend Solar Cells

被引:39
|
作者
Tamai, Yasunari [1 ,5 ]
Ohkita, Hideo [1 ]
Namatame, Miki [2 ]
Marumoto, Kazuhiro [2 ]
Shimomura, Satoru [3 ,4 ]
Yamanari, Toshihiro [3 ]
Ito, Shinzaburo [1 ]
机构
[1] Kyoto Univ, Grad Sch Engn, Dept Polymer Chem, Nishikyo Ku, Kyoto 6158510, Japan
[2] Univ Tsukuba, Div Mat Sci, Tsukuba, Ibaraki 3058573, Japan
[3] Chem Mat Evaluat & Res Base CEREBA, Tsukuba, Ibaraki 3058565, Japan
[4] Toray Industries Ltd, Adv Mat Res Labs, 3-2-1 Sonoyama, Otsu, Shiga 5200842, Japan
[5] Univ Cambridge, Cavendish Lab, JJ Thomson Ave, Cambridge CB3 0HE, England
关键词
STABILITY; RECOMBINATION; AGGREGATION; PERFORMANCE; FILMS;
D O I
10.1002/aenm.201600171
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The mechanism of light-induced degradation in organic solar cells based on regioregular poly(3-hexylthiophene) and indene-C-60 bisadduct is studied by transient absorption (TA) and electron spin resonance (ESR) measurements. After 45 h light exposure under simulated solar illumination at 100 mW cm(-2), the short-circuit current density, open-circuit voltage, and fill factor are all degraded by about 20%-30% relative to the initial photovoltaic parameters. For the assignment of limiting conversion processes in the degraded solar cells, exciton diffusion into a donor/acceptor interface, charge transfer at the interface, charge dissociation into free charge carriers, and charge collection to each electrode are observed before and after the light exposure by the TA measurement. As a result, it is found that the charge collection deteriorates after the light exposure because of light-induced charge trap formation in the bulk of the active layer. The origin of charge traps is further discussed on the basis of ESR measurements and density functional theory calculation.
引用
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页数:7
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