The Observation of Transient Thin Film Structures During the Femto-Second Laser Ablation Process by Using the Soft X-Ray Laser Probe

被引：0

作者：

Hasegawa, N. ^{[1
]}

Nishikino, M. ^{[1
]}

Ishino, M. ^{[1
]}

Ohnishi, N. ^{[2
]}

Ito, A. M. ^{[3
]}

Minami, Y. ^{[4
]}

Baba, M. ^{[5
]}

Faenov, A. Ya. ^{[6
]}

Inogamov, N. ^{[7
]}

Kawachi, T. ^{[1
]}

Kondo, K. ^{[1
]}

Suemoto, T. ^{[4
]}

机构：

[1] Natl Inst Quantum & Radiol Sci & Technol, Kansai Photon Sci Inst, Kizugawa, Kyoto 6190215, Japan

[2] Tohoku Univ, Dept Aerosp Engn, Aoba Ku, 6-6-01 Aramaki AzaAoba, Sendai, Miyagi 9808579, Japan

[3] NIFS, Dept Helical Plasma Res, 322-6 Oroshi Cho, Toki, Gifu 5095292, Japan

[4] Univ Tokyo, Inst Solid State Phys, Kashiwa, Chiba 2778581, Japan

[5] Saitama Med Univ, 38 Moroyama Machi, Saitama 3500495, Japan

[6] Osaka Univ, 1-1 Yamadaoka, Suita, Osaka 5650871, Japan

[7] Russian Acad Sci, Landau Inst Theoret Phys, 1-A Akad Semenova Av, Chernogolovka 142432, Moscow Region, Russia

来源：

X-RAY LASERS 2016 | 2018年 / 202卷

关键词：

D O I：

10.1007/978-3-319-73025-7_40

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We modified a soft X-ray laser (SXRL) interferometer synchronized with a Ti: sapphire laser to observe a single-shot image of the nanoscale structure dynamics of materials induced by an optical laser pulse. The lateral resolution on the sample surface was improved to 0.7 mu m using precise imaging optics. Using this system, we succeeded in observing thin film structures above the solid (or liquid) surface in the femtosecond laser ablation process of metals (Au). The thin film worked as soft X-ray beam splitter. This result shows a thin film was smooth and dense (with a roughness of a few nanometers and near sold density). Furthermore, it gave rise to the possibility of generating novel transient soft X-ray optics.

引用

页码：273 / 277

页数：5

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