Deformation Characteristics of Sn-3Ag-0.5Cu/Cu/Ni-xCu/Ti Joints after Mechanical Test

被引:0
|
作者
Peng, Cung-Nan [1 ]
Duh, Jenq-Gong [1 ]
机构
[1] Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu, Taiwan
来源
2009 INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING (ICEPT-HDP 2009) | 2009年
关键词
PB-FREE; SN-PB; SOLDER; AU/NI/CU; GROWTH; AG;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In BGA packages and flip-chip packages, a Ni layer is often used in the under bump metallurgy (UBM) to serve as a diffusion barrier. However, unstable phase of Ni3Sn4 compound formed between Ni UBM and Sn-rich solder, leading to a critical spalling issue. To avoid the formation of a (Ni, Cu)(3)Sn-4 interlayer between Ni versus the solder, it is known that to increase Cu concentration in the solder was an effective way for the reactive interface [1-8]. In this study, a systematic design of UBM with Cu/Ni-xCu/Ti (x = 0-20wt.%) were adopted to react with Sn-3Ag-0.5Cu ball (phi = 300 mu m). Multi-reflow altered the morphology of the IMCs formed at the interface. FE-EPMA was used to quantitatively analyze intermetallic compounds and to observe fracture surface. Furthermore, the pull and shear tests were employed to measure the mechanical properties of Sn-3Ag-0.5Cu/Cu/Ni-xCu/Ti joints. It was revealed that the shear strength increased with Cu contents in Ni layer and reflow times. The thickness of (Cu,Ni)(6)Sn-5 IMC affected the shear strength. The shear mode changed from ductile (failure inside the bulk solder) to partially brittle (failure at the solder/IMC or IMC/UBM interfaces) in the Sn-3Ag-0.5Cu/Cu/Ni-xCu/Ti (x = 0-20wt.%) joints with the reflow times up to 5. The result of pull test was different from that of shear test, and force direction of tool was critical. The pull strength increased with the number of reflow times. Although the thickness of (Cu, Ni)(6)Sn-5 increased with reflow times, it was too thin to affect pull strength. The Cu concentration of solder did play a critical role in pull strength. It was argued that the Cu concentration of solder could decrease Sn grain size, leading to the higher pull strength. The similar tread of shear and pull results was also found in Chen's [9] and Lehma's [10] studies. The results of this study suggest that Cu-rich Ni-xCu UBM can be used to suppress interfacial spalling and to improve both shear and pull strength in the solder joint.
引用
收藏
页码:967 / 970
页数:4
相关论文
共 50 条
  • [31] Electromigration reliability of Sn-37Pb and Sn-3Ag-1.5Cu/Sn-3Ag-0.5Cu composite flip-chip solder bumps with Ti/Ni(V)/Cu under bump metallurgy
    Lai, YS
    Chen, KM
    Lee, CW
    Kao, CL
    Shao, YH
    PROCEEDINGS OF THE 7TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, VOLS. 1 AND 2, 2005, : 786 - 791
  • [32] Mechanical Behavior of Sn-3.0Ag-0.5Cu/Cu Solder Joints After Isothermal Aging
    Van Luong Nguyen
    Chung, Chin-Sung
    Kim, Ho-Kyung
    JOURNAL OF ELECTRONIC MATERIALS, 2016, 45 (01) : 125 - 135
  • [33] Influence of ZnO Particles Addition on Interface Morphology Evolution of Sn-3Ag-0.5Cu Solder Joints
    Qu, Min
    Cao, Tianze
    Cui, Yan
    Liu, Fengbin
    Jiao, Zhiwei
    MATERIALS SCIENCE, ENERGY TECHNOLOGY AND POWER ENGINEERING II (MEP2018), 2018, 1971
  • [34] Mechanical Behavior of Sn-3.0Ag-0.5Cu/Cu Solder Joints After Isothermal Aging
    Van Luong Nguyen
    Chin-Sung Chung
    Ho-Kyung Kim
    Journal of Electronic Materials, 2016, 45 : 125 - 135
  • [35] Interfacial intermetallic compound growth in Sn-3Ag-0.5Cu/Cu solder joints induced by stress gradient at cryogenic temperatures
    Tian, Ruyu
    Hang, Chunjin
    Tian, Yanhong
    Wu, Bingying
    Liu, Yubin
    Zhao, Jie
    JOURNAL OF ALLOYS AND COMPOUNDS, 2019, 800 : 180 - 190
  • [36] The Role of Lengthscale in the Creep of Sn-3Ag-0.5Cu Solder Microstructures
    Tianhong Gu
    Christopher M. Gourlay
    T. Ben Britton
    Journal of Electronic Materials, 2021, 50 : 926 - 938
  • [37] Effect of Bi on the kinetics of intermetallics growth in Sn-3Ag-0.5Cu/Cu solder joint
    Zhao, Jie
    Qi, Lin
    Wang, Lai
    2006 CONFERENCE ON HIGH DENSITY MICROSYSTEM DESIGN AND PACKAGING AND COMPONENT FAILURE ANALYSIS (HDP '06), PROCEEDINGS, 2006, : 59 - +
  • [38] Crystal orientation of β-Sn grain in Ni(P)/Sn-0.5Cu/Cu and Ni(P)/Sn-1.8Ag/Cu joints
    Seo, Sun-Kyoung
    Cho, Moon Gi
    Lee, Hyuck Mo
    JOURNAL OF MATERIALS RESEARCH, 2010, 25 (10) : 1950 - 1957
  • [39] Shear deformation behavior of a Sn-3Ag-0.5Cu single solder ball at intermediate strain rates
    Joo, Se-Min
    Kim, Ho-Kyung
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2011, 528 (06): : 2711 - 2717
  • [40] Crystal orientation of β-Sn grain in Ni(P)/Sn-0.5Cu/Cu and Ni(P)/Sn-1.8Ag/Cu joints
    Sun-Kyoung Seo
    Moon Gi Cho
    Hyuck Mo Lee
    Journal of Materials Research, 2010, 25 : 1950 - 1957