System-on-chip integrated circuit technology applications on the DIII-D tokamak for multi-field measurements

被引：10

作者：

Zheng, Y. ^{[1
]}

Yu, G. Y. ^{[1
]}

Chen, J. ^{[2
]}

Chen, Y. ^{[1
]}

Zhu, Y. L. ^{[1
]}

Domier, C. W. ^{[1
]}

Brower, D. L. ^{[2
]}

Luhmann, N. C., Jr. ^{[1
]}

机构：

[1] Univ Calif Davis, Elect & Comp Engn, One Shields Ave, Davis, CA 95616 USA

[2] Univ Calif Los Angeles, Phys & Astron, 475 Portola Plaza, Los Angeles, CA 90095 USA

来源：

JOURNAL OF INSTRUMENTATION | 2022年 / 17卷 / 01期

关键词：

Nuclear instruments and methods for hot plasma diagnostics; Plasma diagnostics - interferometry; spectroscopy and imaging;

D O I：

10.1088/1748-0221/17/01/C01013

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Several mm-wave diagnostics on the DIII-D tokamak provide multi-scale and multidimensional measurements of plasma profile evolution and turbulence fluctuations. Mm-wave fusion plasma diagnostics that adopt system-on-chip integrated circuit technology can provide better space utilization, flexible installation, and improved sensitivity. In order to further extend this technology for additional fusion facilities with a higher toroidal magnetic field, V-band (55-75 GHz) and F-band (90-140 GHz) chips for Microwave Imaging Reflectometer (MIR) and Electron Cyclotron Emission Imaging (ECEI) instruments are developed and tested in the Davis Millimeter Wave Research Center (DMRC). Current measurement data show that correlation between these SoC-based diagnostic instruments with other state-of-the-art diagnostics enables co-located multi-field turbulence fluctuation measurement.

引用

页数：11

共 22 条

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