In-Situ Microtomographic Characterization of Single-Cavity Growth During High-Temperature Creep of Leaded Brass

被引：9

作者：

Isaac, A. ^{[1
]}

Dzieciol, K. ^{[2
]}

Sket, F. ^{[2
]}

Borbely, A. ^{[2
]}

机构：

[1] Helmholtz Zentrum Berlin Mat & Energie GmbH, D-14109 Berlin, Germany

[2] Max Planck Inst Eisenforsch GmbH, D-40237 Dusseldorf, Germany

来源：

METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE | 2011年 / 42A卷 / 10期

关键词：

POWER-LAW CREEP; VOID GROWTH; INTERGRANULAR FRACTURE; DIFFUSIVE CAVITATION; DAMAGE; QUANTIFICATION; TOMOGRAPHY; ALLOYS; FLOW;

D O I：

10.1007/s11661-011-0781-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Synchrotron microtomography was used for in-situ characterization of high-temperature creep damage in leaded brass. Applying image registration to subsequent tomographic reconstructions, the volumetric growth rate of single cavities with equivalent radii between 2 and 4.3 mu m was assessed. We conclude from the volume dependence of the growth rates that both the viscous flow and grain boundary (GB) diffusion mechanisms influence void growth. We show that void growth in leaded brass is retarded by negative stress triaxiality, which develops in the matrix during heating the specimen to the deformation temperature.

引用

页码：3022 / 3030

页数：9

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