Design of a Reference Device for Surge Immunity Inter-laboratory Comparison

被引：0
|
作者：
Tas, Emrah [1 ]
Pythoud, Frederic [1 ]
Muehlemann, Beat [1 ]
机构：
[1] Swiss Fed Inst Metrol, Electromagnet Comptabil Lab, Bern, Switzerland
来源：
2018 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC EUROPE) | 2018年
关键词：
Equipment under test (EUT); Electromagnetic Compatibility (EMC); IEC; 61000-4-5; immunity; inter-laboratory comparison (ILC); proficiency testing; surge;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this publication, we present a reference device for surge immunity inter-laboratory comparison. With the help of this device, the capabilities of the test laboratories regarding the correct interpretation and implementation of the standard IEC 61000-4-5 [1] can be assessed. This device is intended to be tested as a normal EUT in surge immunity testing, and it has the ability to record the applied test parameters. The architecture and a first evaluation of this device are presented. The device stability and the measurement repeatability issues are thoroughly investigated.
引用
收藏
页码：482 / 487
页数：6
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