Design of a Reference Device for Surge Immunity Inter-laboratory Comparison

被引：0

作者：

Tas, Emrah ^{[1
]}

Pythoud, Frederic ^{[1
]}

Muehlemann, Beat ^{[1
]}

机构：

[1] Swiss Fed Inst Metrol, Electromagnet Comptabil Lab, Bern, Switzerland

来源：

2018 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC EUROPE) | 2018年

关键词：

Equipment under test (EUT); Electromagnetic Compatibility (EMC); IEC; 61000-4-5; immunity; inter-laboratory comparison (ILC); proficiency testing; surge;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this publication, we present a reference device for surge immunity inter-laboratory comparison. With the help of this device, the capabilities of the test laboratories regarding the correct interpretation and implementation of the standard IEC 61000-4-5 [1] can be assessed. This device is intended to be tested as a normal EUT in surge immunity testing, and it has the ability to record the applied test parameters. The architecture and a first evaluation of this device are presented. The device stability and the measurement repeatability issues are thoroughly investigated.

引用

页码：482 / 487

页数：6

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