A quick electrical inspection method of solder joint quality for LED products

被引:1
|
作者
Zhang, Jianhua [1 ,3 ]
Que, Xiufu [1 ,3 ]
Liu, Yanan [2 ,3 ]
Chen, Weining [4 ]
Tao, Guoqiao [4 ]
Yang, Lianqiao [2 ,3 ]
机构
[1] Shanghai Univ, Sch Mech Engn & Automat, Shanghai 200072, Peoples R China
[2] Shanghai Univ, Sch Mat Sci & Engn, Shanghai 20072, Peoples R China
[3] Shanghai Univ, Minist Educ, Key Lab Adv Display & Syst Applicat, Shanghai 200072, Peoples R China
[4] Philips China Investment Co Ltd, Shanghai 200233, Peoples R China
关键词
LED; K coefficient; heating curve; quick electric test; THERMAL-RESISTANCE; IDENTIFICATION; TEMPERATURE;
D O I
10.1088/0957-0233/27/6/065005
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Solder joint qualities of light-emitting diodes (LED) lamps have a significant effect on their lifetime. Due to variations in LEDs, the product lifetime is determined by the lowest performing component of the product when multi-LEDs are used. In this paper, we propose a quick electrical inspection method of solder joint quality for LED products, which is obtained by the heating curve measurement for a short time with the forward voltage as a temperature sensitive parameter. The utility of this quick inspection method is verified by the measurement of a solder voids ratio based on the most commonly used approaches in the industry-x-ray. The proposed method is cost effective and only needs around 1-5 s for each LED, which is about one third of the x-ray. Therefore, the quick electrical test method is both meaningful and promising especially when carrying out quality tests on large quantities of solder and can be a highly recommended method to be adopted by the LED lighting industry.
引用
收藏
页数:6
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