606-nm InGaN Amber Micro-Light-Emitting Diodes With an On-Wafer External Quantum Efficiency of 0.56%

被引:44
|
作者
Zhuang, Zhe [1 ]
Iida, Daisuke [1 ]
Velazquez-Rizo, Martin [1 ]
Ohkawa, Kazuhiro [1 ]
机构
[1] King Abdullah Univ Sci & Technol KAUST, Comp Elect & Math Sci & Engn CEMSE Div, Thuwal 23955, Saudi Arabia
关键词
Light emitting diodes; Current density; Temperature measurement; Semiconductor device measurement; Power generation; Indium tin oxide; Wavelength measurement; InGaN; amber micro-light-emitting diode; on-wafer external quantum efficiency; characteristic temperature; EMISSION; LEDS;
D O I
10.1109/LED.2021.3080985
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We demonstrated amber InGaN 47 x 47 mu m(2) micro-light-emitting diodes (mu LEDs) with the peak wavelength of 606 nm and full-width at maximum (FWHM) of 50 nm at 20 A/cm(2). The amber mu LEDs exhibited a 33-nm blue-shift of the peak wavelength and obtain broader FWHMs to approximately 56 nm at 5 to 100 A/cm(2). The peak on-wafer external quantum efficiency was 0.56% at 20 A/cm(2). The characteristic temperature was 50-80 K at 20 to 60 A/ cm(2) but increased to 120-140 K at 80 to 100 A/cm(2). The strong increase in the characteristic temperature from 60 to 80A/cm(2) couldmainly be attributed to the saturation of the Shockley-Read-Hall non-radiative recombination at high current densities.
引用
收藏
页码:1029 / 1032
页数:4
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