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- [32] Characterization of thin films based on TiO2 by XRD, AFM and XPS measurements PROCEEDINGS OF 2008 INTERNATIONAL STUDENTS AND YOUNG SCIENTIST WORKSHOP PHOTONICS AND MICROSYSTEMS, 2008, : 96 - 99
- [34] AFM characterization of the initial growth stages of CdTe on Si(111) substrates PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2002, 232 (01): : 173 - 176
- [35] Raman-AFM Instrumentation and Characterization of SERS Substrates and Carbon Nanotubes 26TH SOUTHERN BIOMEDICAL ENGINEERING CONFERENCE: SBEC 2010, 2010, 32 : 500 - 503
- [39] XPS, AFM and EIA studies of IgG molecules site-directed immobilized on APTES modified silicon wafer surfaces MOLECULAR CRYSTALS AND LIQUID CRYSTALS SCIENCE AND TECHNOLOGY SECTION A-MOLECULAR CRYSTALS AND LIQUID CRYSTALS, 1999, 337 : 277 - 280
- [40] Phase behavior of two-component thiol SAMs on immobilized gold nanoparticles characterized by XPS ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2011, 242