Neutron study of in-plane skyrmions in MnSi thin films

被引：23

作者：

Meynell, S. A. ^{[1
]}

Wilson, M. N. ^{[1
]}

Krycka, K. L. ^{[2
]}

Kirby, B. J. ^{[2
]}

Fritzsche, H. ^{[3
]}

Monchesky, T. L. ^{[1
]}

机构：

[1] Dalhousie Univ, Dept Phys & Atmospher Sci, Halifax, NS B3H 4R2, Canada

[2] NIST, Ctr Neutron Res, Gaithersburg, MD 20899 USA

[3] Canadian Nucl Labs, Chalk River, ON K0J 1J0, Canada

来源：

PHYSICAL REVIEW B | 2017年 / 96卷 / 05期

基金：

加拿大自然科学与工程研究理事会;

关键词：

REAL-SPACE OBSERVATION; CRYSTALS; DYNAMICS; LATTICE; STATES;

D O I：

10.1103/PhysRevB.96.054402

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The magnetic structure of the in-plane skyrmions in epitaxial MnSi/Si(111) thin films is probed in three dimensions by the combination of polarized neutron reflectometry (PNR) and small-angle neutron scattering (SANS). We demonstrate that skyrmions exist in a region of the phase diagram above a temperature of 10 K. PNR shows the skyrmions are confined to the middle of the film due to the potential well formed by the surface twists. However, SANS shows that there is considerable disorder within the plane indicating that the magnetic structure is a two-dimensional skyrmion glass.

引用

页数：9

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