Compact Modeling of the Switching Dynamics and Temperature Dependencies in TiOx Memristors-Part II: Physics-Based Model

被引:3
|
作者
Vaidya, Dhirendra [1 ]
Kothari, Shraddha [1 ]
Abbey, Thomas [1 ]
Stathopoulos, Spyros [1 ]
Michalas, Loukas [1 ]
Serb, Alexantrou [1 ]
Prodromakis, Themis [1 ]
机构
[1] Univ Southampton, Ctr Elect Frontiers, Southampton SO17 1BJ, Hants, England
基金
英国工程与自然科学研究理事会;
关键词
Compact model; metal-oxide memristors; physics-based model; pulsed resistance transient (PRT) measurements; resistive RAMs; Schottky emission; static I-V; switching dynamics; temperature dependence; TiOx memristors;
D O I
10.1109/TED.2021.3102002
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In the second part of this series, we propose a physics-based model for describing the temperature dependence of TiOx-based memristors, both switching and static. We show that the current-voltage (I-V) characteristics of memristor in the nonswitching regime, indicating a Schottky emission mechanism, can be described by minor modifications to the Schottky current equation. This leads to a physics-based static I-V compact model. Simultaneously, we show that the temperature dependence of the switching dynamics model parameters naturally emerges as a mere scaling factor from the static I-V model. This is a computationally efficient approach, which does not require any additional parameters to extend the switching dynamics model for incorporating thermal dependence.
引用
收藏
页码:4885 / 4890
页数:6
相关论文
共 37 条
  • [1] Compact Modeling of the Switching Dynamics and Temperature Dependencies in TiOx-Based Memristors - Part I: Behavioral Model
    Vaidya, Dhirendra
    Kothari, Shraddha
    Abbey, Thomas
    Stathopoulos, Spyros
    Michalas, Loukas
    Serb, Alexantrou
    Prodromakis, Themis
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2021, 68 (10) : 4877 - 4884
  • [2] Fatigue of NbOx-Based Locally Active Memristors-Part II: Mechanisms and Modeling
    Li, Yu
    Ding, Yanting
    Zhang, Xumeng
    Jia, Shujing
    Wang, Wei
    Li, Yang
    Wang, Ming
    Jiang, Hao
    Liu, Qi
    Xu, Ningsheng
    Liu, Ming
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2023, 70 (12) : 6606 - 6612
  • [3] Physics-based compact model of nanoscale MOSFETs - Part II: Effects of degeneracy on transport
    Mugnaini, G
    Iannaccone, G
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2005, 52 (08) : 1802 - 1806
  • [4] Implementation and validation of a physics-based circuit model for IGCT with full temperature dependencies
    Wang, X
    Caiafa, A
    Hudgins, JL
    Santi, E
    Palmer, PR
    PESC 04: 2004 IEEE 35TH ANNUAL POWER ELECTRONICS SPECIALISTS CONFERENCE, VOLS 1-6, CONFERENCE PROCEEDINGS, 2004, : 597 - 603
  • [5] Physics-based modeling of sodium-ion batteries part II. Model and validation
    Chayambuka, Kudakwashe
    Mulder, Grietus
    Danilov, Dmitri L.
    Notten, Peter H. L.
    ELECTROCHIMICA ACTA, 2022, 404
  • [6] A Comprehensive Physics-Based Compact Model for CNT Thin Film Transistors- Part II: Ohmic Contact
    Tripathy, Srijeet
    Kumari, Ambika
    Bhattacharyya, Tarun Kanti
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2024, 71 (09) : 5717 - 5724
  • [7] A Physics-Based Trap-Assisted Tunneling Current Model for Cryogenic Temperature Compact Modeling of SiGe HBTs
    Xu, Ziyan
    Niu, Guofu
    Luo, Lan
    Cressler, John D.
    SIGE, GE, AND RELATED COMPOUNDS 4: MATERIALS, PROCESSING, AND DEVICES, 2010, 33 (06): : 301 - 310
  • [8] A Physics-Based Compact Model of Stochastic Switching in Spin-Transfer Torque Magnetic Memory
    Carboni, Roberto
    Vernocchi, Elena
    Siddik, Manzar
    Harms, Jon
    Lyle, Andy
    Sandhu, Gurtej
    Ielmini, Daniele
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2019, 66 (10) : 4176 - 4182
  • [9] A Physics-Based Compact Model for Material- and Operation-Oriented Switching Behaviors of CBRAM
    Zhao, Y. D.
    Hu, J. J.
    Huang, P.
    Yuan, F.
    Chai, Y.
    Liu, X. Y.
    Kang, J. F.
    2016 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), 2016,
  • [10] A Physics-Based Compact Model for Ultrathin Black Phosphorus FETs-Part II: Model Validation Against Numerical and Experimental Data
    Yarmoghaddam, Elahe
    Haratipour, Nazila
    Koester, Steven J.
    Rakheja, Shaloo
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2020, 67 (01) : 397 - 405