Observation of the mica surface by atomic force microscopy

被引：15

作者：

Liu, ZG ^{[1
]}

Li, Z ^{[1
]}

Zhou, HL ^{[1
]}

Wei, G ^{[1
]}

Song, YH ^{[1
]}

Wang, L ^{[1
]}

机构：

[1] Chinese Acad Sci, Changchun Inst Appl Chem, Grad Sch, State Key Lab Electroanalyt Chem,Analyt Chem Dept, Changchun 130022, Jilin, Peoples R China

来源：

MICRON | 2005年 / 36卷 / 06期

关键词：

atomic force microscopy; AFM; mica; condensed water;

D O I：

10.1016/j.micron.2005.03.007

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Freshly cleaved mica and a mica surface treated with pure water and dilute-salt solution have been investigated by Atomic Force Microscopy (AFM). On the bare mica surface (after repeated scanning), small dots and islands were observed. The disappearance of these dots and islands has also been captured by AFM. We believe these structures to be condensed water. The water meniscus between AFM tip and mica surface is considered as the source of this water structure. On the mica surface treated with pure water and dilute-salt solution, network structures are frequently observed by AFM. (c) 2005 Elsevier Ltd. All rights reserved.

引用

页码：525 / 531

页数：7

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