GaN/InGaN avalanche phototransistors

被引:22
|
作者
Shen, Shyh-Chiang [1 ,2 ]
Kao, Tsung-Ting [1 ,2 ]
Kim, Hee-Jin [1 ,2 ]
Lee, Yi-Che [1 ,2 ]
Kim, Jeomoh [1 ,2 ]
Ji, Mi-Hee [1 ,2 ]
Ryou, Jae-Hyun [1 ,2 ]
Detchprohm, Theeradetch [1 ,2 ]
Dupuis, Russell D. [1 ,2 ,3 ]
机构
[1] Georgia Inst Technol, Ctr Compound Semicond, Atlanta, GA 30332 USA
[2] Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA
[3] Georgia Inst Technol, Sch Mat Sci & Engn, Atlanta, GA 30332 USA
基金
美国国家科学基金会;
关键词
SEMICONDUCTOR-METAL PHOTODETECTORS; HETEROJUNCTION PHOTOTRANSISTOR; PHOTO-TRANSISTOR; CAP LAYERS; PHOTODIODES;
D O I
10.7567/APEX.8.032101
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report on III-nitride (III-N) avalanche phototransistor (APT) action by illuminating ultraviolet (UV) photons onto a GaN/InGaN npn heterojunction bipolar transistor in an open-base configuration. A high responsivity of >1A/W was measured for the device operating at a collector-to-emitter voltage (V-CE) of <15V in the phototransistor mode. The carrier multiplication in the reversed biased collector leads to a photocurrent avalanche as V-CE increases. At lambda = 380 nm, the GaN/InGaN APT shows a responsivity of >68A/W at V-CE = 95V. The InGaN APT demonstrates the feasibility of using III-N bipolar transistor structures for high-sensitivity UV photodetection applications. (C) 2015 The Japan Society of Applied Physics
引用
收藏
页数:4
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