Tunneling in frustrated total internal reflection: A comparison of different approaches

被引:1
|
作者
Ranfagni, Anedio [1 ]
Moretti, Paolo [2 ]
Cacciari, Ilaria [1 ]
Vitali, Maria Angela [3 ]
机构
[1] CNR, Ist Fis Appl Nello Carrara, I-50019 Florence, Italy
[2] CNR, Ist Sist Compless, I-50019 Florence, Italy
[3] Univ Florence, Scuola Special Ottica, I-50121 Florence, Italy
来源
PHYSICAL REVIEW E | 2007年 / 76卷 / 04期
关键词
Electron tunneling;
D O I
10.1103/PhysRevE.76.047601
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
Tunneling processes in frustrated total internal reflection are reexamined in order to compare the results already obtained from adopting a procedure based on a transition-element analysis with those recently reported on the basis of a statistical method applied to a Brownian-like motion. A close agreement between the two approaches can be established, at optical and microwave scales, when suitable values of the involved parameters are adopted.
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页数:3
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