Tunneling in frustrated total internal reflection: A comparison of different approaches

被引：1

作者：

Ranfagni, Anedio ^{[1
]}

Moretti, Paolo ^{[2
]}

Cacciari, Ilaria ^{[1
]}

Vitali, Maria Angela ^{[3
]}

机构：

[1] CNR, Ist Fis Appl Nello Carrara, I-50019 Florence, Italy

[2] CNR, Ist Sist Compless, I-50019 Florence, Italy

[3] Univ Florence, Scuola Special Ottica, I-50121 Florence, Italy

来源：

PHYSICAL REVIEW E | 2007年 / 76卷 / 04期

关键词：

Electron tunneling;

D O I：

10.1103/PhysRevE.76.047601

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

Tunneling processes in frustrated total internal reflection are reexamined in order to compare the results already obtained from adopting a procedure based on a transition-element analysis with those recently reported on the basis of a statistical method applied to a Brownian-like motion. A close agreement between the two approaches can be established, at optical and microwave scales, when suitable values of the involved parameters are adopted.

引用

页数：3

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