X-ray diffraction determination of easiest slip planes in amorphous-crystalline polymers

被引：3
|
作者：
Ginzburg, BM
Sultanov, N
机构：
[1] Russian Acad Sci, Inst Problems Machine Sci, St Petersburg 199178, Russia
[2] Tajik State Univ, Dushanbe 734000, Tajikistan
来源：
TECHNICAL PHYSICS | 2001年 / 46卷 / 02期
关键词：
Polymer; Polyethylene; Slip Plane; Easy Slip; Diffraction Determination;
D O I：
10.1134/1.1349288
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A simple X-ray diffraction technique for determining the easiest slip planes in amorphous-crystalline polymer grains is suggested. The efficiency of the technique was demonstrated with polyethylene and polyamide-6. (C) 2001 MAIK "Nauka/Interperiodica".
引用
收藏
页码：258 / 261
页数：4
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