X-ray diffraction determination of easiest slip planes in amorphous-crystalline polymers

被引：3

作者：

Ginzburg, BM

Sultanov, N

机构：

[1] Russian Acad Sci, Inst Problems Machine Sci, St Petersburg 199178, Russia

[2] Tajik State Univ, Dushanbe 734000, Tajikistan

来源：

TECHNICAL PHYSICS | 2001年 / 46卷 / 02期

关键词：

Polymer; Polyethylene; Slip Plane; Easy Slip; Diffraction Determination;

D O I：

10.1134/1.1349288

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A simple X-ray diffraction technique for determining the easiest slip planes in amorphous-crystalline polymer grains is suggested. The efficiency of the technique was demonstrated with polyethylene and polyamide-6. (C) 2001 MAIK "Nauka/Interperiodica".

引用

页码：258 / 261

页数：4

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