Subthreshold performance of deep-submicrometer dual gate material p-MOSFET and CMOS circuits for ultra low power analog/mixed-signal applications

被引:0
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作者
Chakraborty, Saurav [1 ]
Mallik, Abhijit [2 ]
Sarkar, Chandan Kumar [3 ]
机构
[1] Tyfone Commun Dev India Pvt Ltd, ITPL, Unit 4-7,2nd Floor,DISCOVERER Bldg,Whitefield Rd, Bangalore 560066, Karnataka, India
[2] Univ Calcutta, Dept Elect Sci, Kolkata 700009, W Bengal, India
[3] Univ Jadavpur, Dept Elect & Telecommun Engn, Kolkata 700032, India
关键词
D O I
10.1109/ICMEL.2008.4559244
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Analog circuits based on subthreshold operation of CMOS devices are very attractive for ultra-low power, high gain and moderate frequency applications. The effect of dual material gate (DMG) on p-MOSFET for subthreshold analog operation is systematically investigated in this paper. As p- MOSFET plays a major role in CMOS circuits as active load, we simulated and studied the analog subthreshold performance parameters like output resistance (R-o), Early voltage (V-A) and intrinsic gain of 100nm DMG p-MOS devices. The features like transconductance enhancement and suppression of short-channel effects in DMG p-MOSFET were compared with that in the single material gate (SMG) p-MOSFET. We also studied the circuit performance of a CMOS amplifier and observed the improvement in gain for DMG p-MOS based circuit. The DMG CMOS devices are found to have significantly better performance as compared to their SMG counterpart. A more than 70% improvement in the voltage gain is observed for the CMOS amplifiers when dual-material gates, instead of single-material gates, are used in both the n- and p-channel devices.
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页码:145 / +
页数:3
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