共 50 条
- [21] Bias-induced spatially resolved growth and removal of Si-oxide by atomic force microscopy APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2003, 76 (01): : 63 - 69
- [23] Characterization of thin oxide layers by use of the atomic force acoustic microscopy 2008 31ST INTERNATIONAL SPRING SEMINAR ON ELECTRONICS TECHNOLOGY: RELIABILITY AND LIFE-TIME PREDICTION, 2008, : 167 - +
- [24] Nanoscale patterning of Au films on Si surfaces by atomic force microscopy JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (12A): : 6952 - 6954
- [28] Roughness characterization of Si(110) etched in TMAH by atomic force microscopy MATERIALS SCIENCE OF MICROELECTROMECHANICAL SYSTEMS (MEMS) DEVICES II, 2000, 605 : 305 - 309
- [29] Nanoscale patterning of Au films on Si surfaces by atomic force microscopy Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1999, 38 (12 A): : 6952 - 6954