Fan-Out Panel-Level PCB-Embedded SiC Power MOSFETs Packaging

被引:29
|
作者
Hou, Fengze [1 ,2 ,3 ]
Wang, Wenbo [4 ]
Ma, Rui [1 ,3 ]
Li, Yonghao [5 ]
Han, Zhonglin [1 ]
Su, Meiying [1 ,3 ]
Li, Jun [1 ,3 ]
Yu, Zhongyao [1 ,3 ]
Song, Yang [1 ,3 ]
Wang, Qidong [1 ,3 ]
Chen, Min [5 ]
Cao, Liqiang [1 ,3 ]
Zhang, Guoqi [2 ]
Ferreira, Braham [6 ,7 ]
机构
[1] Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China
[2] Delft Univ Technol, Dept Microelect, NL-2628 Delft, Netherlands
[3] Natl Ctr Adv Packaging, Wuxi 214135, Jiangsu, Peoples R China
[4] Shenzhen Inst Wide Bandgap Semicond WinS, Shenzhen 518055, Peoples R China
[5] Zhejiang Univ, Coll Elect Engn, Hangzhou 310027, Peoples R China
[6] Delft Univ Technol, Dept Elect Sustainable Energy, NL-2628 Delft, Netherlands
[7] Univ Twente, Dept Telecommun Engn, NL-7522 Enschede, Netherlands
基金
中国国家自然科学基金;
关键词
Electro-thermo-mechanical codesign; printed circuit board (PCB)-embedded package; phase-leg silicon carbide (SiC) metal-oxide-semiconductor field-effect transistor (MOSFET) power module; static characterization; switching characterization; RELIABILITY; ELECTRONICS; WARPAGE;
D O I
10.1109/JESTPE.2019.2952238
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this article, a novel fan-out panel-level printed circuit board (PCB)-embedded package for phase-leg silicon carbide (SiC) metal-oxide-semiconductor field-effect transistor (MOSFET) power module is presented. Electro-thermo-mechanical co-design was conducted, and the maximum package parasitic inductance was found to be about 1.24 nH at 100 kHz. Compared with wire-bonded packages, the parasitic inductances of the PCB-embedded package decreased at least by 87.6%. Compared with blind via structure, the thermal resistance of the proposed blind block structure reduced at most by about 26%, and the stress of the SiC MOSFETs decreased by about 45.2%. Then, a novel PCB-embedded packaging process was developed, and three key packaging processes were analyzed. Furthermore, effect of PCB-embedded package on static characterization of SiC MOSFET was analyzed, and it was found that: 1) Output current of PCB-embedded package was decreased under a certain gate-source voltage compared to SiC die; 2) Miller capacitance of SiC MOSFET was increased thanks to parasitic capacitance induced by package; and 3) compared with SiC die, nonflat miller plateau of the PCB-embedded package extends, and as drain-source voltage increases, the nonflat miller plateau extends. Lastly, switching characteristics of the PCB-embedded package and TO-247 package were compared. The results show that the PCB-embedded package has smaller parasitic inductances.
引用
收藏
页码:367 / 380
页数:14
相关论文
共 50 条
  • [41] Dry etch processing in fan-out panel-level packaging - An application for high-density vertical interconnects and beyond
    Schein, Friedrich-Leonhard
    Voigt, Christian
    Gerhold, Lutz
    Tsigaras, Ioannis
    Elghazzali, Mohamed
    Sawamoto, Hirofumi
    Strolz, Ewald
    Retteruncier, Roland
    Kahle, Ruben
    Boettcher, Lars
    IEEE 72ND ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2022), 2022, : 1518 - 1523
  • [42] An RDL-First Fan-Out Panel-Level Package for Heterogeneous Integration Applications
    Lin, Yu-Min
    Wu, Sheng-Tsai
    Wang, Chun-Min
    Lee, Chia-Hsin
    Huang, Shin-Yi
    Lin, Ang-Ying
    Chang, Tao-Chih
    Lin, Puru Bruce
    Ko, Cheng-Ta
    Chen, Yu-Hua
    Su, Jay
    Liu, Xiao
    Prenger, Luke
    Chen, Kuan-Neng
    2019 IEEE 69TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2019, : 1463 - 1469
  • [43] Design of a Fan-Out Panel-Level SiC MOSFET Power Module Using Ant Colony Optimization-Back Propagation Neural Network
    Qian, Yichen
    Hou, Fengze
    Fan, Jiajie
    Lv, Quanya
    Fan, Xuejun
    Zhang, Guoqi
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2021, 68 (07) : 3460 - 3467
  • [44] Carrier Glass Substrates for Fan-out Wafer/Panel Level Packaging
    Hayashi, Kazutaka
    2017 INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING (ICEP), 2017, : 494 - 497
  • [45] Evaluation of Materials for Fan-Out Panel Level Packaging (FOPLP) Applications
    Sekhar, Vasarla Nagendra
    Rao, Vempati Srinivasa
    Yamamoto, Kazunori
    Fujinaga, Tetsushi
    Jono, Koichi
    Matsui, Hiroshi
    Yoshiteru, Takaya
    Yukio, Horiguchi
    2018 IEEE 20TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE (EPTC), 2018, : 93 - 97
  • [46] Process Flow and Cost Modelling for Fan-Out Panel Level Packaging
    Billaud, Mathilde
    Zedel, Marines
    Stobbe, Lutz
    Braun, Tanja
    Nissen, Nils
    Lang, Klaus-Dieter
    2019 22ND EUROPEAN MICROELECTRONICS AND PACKAGING CONFERENCE & EXHIBITION (EMPC), 2019,
  • [47] Die Shift on Chip First Panel Level Fan-out Packaging
    Huo, Yan
    Chen, Li
    Zhou, Wenwu
    2024 25TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, ICEPT, 2024,
  • [48] How to Manipulate Warpage in Fan-out Wafer and Panel Level Packaging
    Braun, Tanja
    Hoelck, Ole
    Adler, Marius
    Obst, Mattis
    Voges, Steve
    Becker, Karl-Friedrich
    Aschenbrenner, Rolf
    Voitel, Marcus
    Dreissigacker, Marc
    Schneider-Ramelow, Martin
    PROCEEDINGS OF THE IEEE 74TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, ECTC 2024, 2024, : 1 - 6
  • [49] Warpage Simulation and Optimization of Panel Level Fan-out Embedded Package
    Cui, Ruibin
    Kuang, Ziliang
    Yang, Guannan
    Cui, Chengqiang
    Zhang, Yu
    2020 21ST INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2020,
  • [50] Advances in Dry Etch Processing for High-Density Vertical Interconnects in Fan-Out Panel-Level Packaging and IC Substrates
    Schein, Friedrich-Leonhard
    Elghazzali, Mohammed
    Voigt, Christian
    Tsigaras, Ioannis
    Sawamoto, Hirofumi
    Strolz, Ewald
    Rettenmeier, Roland
    Boettcher, Lars
    IEEE 71ST ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2021), 2021, : 1910 - 1915