Novel Design of a Ternary-CMOS With Vertical-Channel Double-Gate Field-Effect Transistors

被引:1
|
作者
Kim, Jiho [1 ]
Kim, Sangwoo [1 ]
Hwang, Jinyoung [1 ]
机构
[1] Korea Aerosp Univ, Sch Elect & Informat Engn, Goyang Si 10540, South Korea
基金
新加坡国家研究基金会;
关键词
Logic gates; Tunneling; Junctions; Semiconductor process modeling; Solid modeling; Performance evaluation; P-n junctions; MOSFET; ternary CMOS (T-CMOS); tunneling; vertical channel;
D O I
10.1109/TED.2022.3178362
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A tunneling-based ternary CMOS (T-CMOS) offering a low standby current and fast switching speed is developed using a novel device structure for field-effect transistors (FETs). In the new transistor devices, referred to as vertical-channel double-gate (VCDG)-FETs, a vertical current path from drain to source is formed on the drain, and a body placed below the drain is electrically isolated, except for the tunneling junction appearing at the drain and body interface. At the junction, most of the OFF-state current flows, which is independent of the gate voltage. Furthermore, the OFF-state current can be further reduced to the order of 10(-17) A by employing a drain with a retrograded doping profile. In this profile, the channel-drain junction tunneling current, which varies with the gate voltage, is substantially suppressed to less than the body-drain junction tunneling current in the OFF state. In addition, an electrostatic channel controlled using double gates facilitates a small subthreshold swing (SSW) of 65 mV/dec. With p- and n-channel VCDG-FETs, a T-CMOS exhibiting three logic states is developed with a standby current on the order of 1 pA and transfer characteristics with a very narrow transition width.
引用
收藏
页码:4081 / 4087
页数:7
相关论文
共 50 条
  • [1] Design optimization of vertical double-gate tunneling field-effect transistors
    Young Jun Yoon
    Sung Yun Woo
    Jae Hwa Seo
    Jae Sung Lee
    Yun Soo Park
    Jung-Hee Lee
    In Man Kang
    Journal of the Korean Physical Society, 2012, 61 : 1679 - 1682
  • [2] Design optimization of vertical double-gate tunneling field-effect transistors
    Yoon, Young Jun
    Woo, Sung Yun
    Seo, Jae Hwa
    Lee, Jae Sung
    Park, Yun Soo
    Lee, Jung-Hee
    Kang, In Man
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2012, 61 (10) : 1679 - 1682
  • [3] Simulation study on short channel double-gate junctionless field-effect transistors
    吴美乐
    靳晓诗
    揣荣岩
    刘溪
    JongHo Lee
    Journal of Semiconductors, 2013, 34 (03) : 35 - 42
  • [4] BREAKDOWN PHENOMENA IN DOUBLE-GATE FIELD-EFFECT TRANSISTORS
    COBBOLD, RSC
    TROFIMENKO, FN
    PROCEEDINGS OF THE IEEE, 1964, 52 (11) : 1375 - &
  • [5] Simulation study on short channel double-gate junctionless field-effect transistors
    吴美乐
    靳晓诗
    揣荣岩
    刘溪
    Jong-Ho Lee
    Journal of Semiconductors, 2013, (03) : 35 - 42
  • [6] Simulation study on short channel double-gate junctionless field-effect transistors
    Wu, Meile
    Jin, Xiaoshi
    Chuai, Rongyan
    Liu, Xi
    Lee, Jong-Ho
    JOURNAL OF SEMICONDUCTORS, 2013, 34 (03)
  • [7] Fabrication of a vertical-channel double-gate metal-oxide-semiconductor field-effect transistor using a neutral beam etching
    Endo, K
    Noda, S
    Masahara, M
    Kubota, T
    Ozaki, T
    Samukawa, SJ
    Liu, YX
    Ishii, K
    Ishikawa, Y
    Sugimata, E
    Matsukawa, T
    Takashinia, H
    Yamauchi, H
    Suzuki, E
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2006, 45 (8-11): : L279 - L281
  • [8] Self-aligned, vertical-channel, polymer field-effect transistors
    Stutzmann, N
    Friend, RH
    Sirringhaus, H
    SCIENCE, 2003, 299 (5614) : 1881 - 1884
  • [9] Organic double-gate field-effect transistors: Logic-AND operation
    Chua, LL
    Friend, RH
    Ho, PKH
    APPLIED PHYSICS LETTERS, 2005, 87 (25) : 1 - 3
  • [10] Tunable contact resistance in double-gate organic field-effect transistors
    Xu, Yong
    Darmawan, Peter
    Liu, Chuan
    Li, Yun
    Minari, Takeo
    Ghibaudo, Gerard
    Tsukagoshi, Kazuhito
    ORGANIC ELECTRONICS, 2012, 13 (09) : 1583 - 1588