Nematic anchoring transitions on bistable SiO films driven by temperature and impurities

被引:14
|
作者
Barberi, R [1 ]
Giocondo, M
Iovane, M
Dozov, I
Polossat, E
机构
[1] Univ Calabria, Ist Nazl Fis Mat, Dip Fis, INFM CS, I-87036 Rende, CS, Italy
[2] Univ Paris 11, Phys Solides Lab, F-91405 Orsay, France
关键词
D O I
10.1080/026782998206461
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The influence of temperature and impurities on the surface orientation of nematic 5CB on obliquely SiO evaporated glass plates has been studied. We observe on cooling a continuous anchoring transition from the planar alignment to the tilted one. The experimental data have been interpreted by using elastic models developed by Durand and coworkers in which the surface order parameter can vary in space, close to the surface.
引用
收藏
页码:23 / 29
页数:7
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