Dielectric and conductor loss quantification for microstrip reflectarray: Simulations and measurements

被引：38

作者：

Rajagopalan, Harish ^{[1
]}

Rahmat-Samii, Yahya ^{[1
]}

机构：

[1] Univ Calif Los Angeles, Dept Elect Engn, Los Angeles, CA 90095 USA

来源：

IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION | 2008年 / 56卷 / 04期

关键词：

conductor loss; dielectric loss; reflectarray;

D O I：

10.1109/TAP.2008.919225

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The conductor and dielectric loss mechanisms in microstrip reflectarray are described using simulation models and waveguide measurements. The dielectric constant and loss tangent variation with frequency is obtained for a particular substrate using existing datasheets. Variable size patch rellectarray element was studied for loss characterization. The effect of these losses is characterized and the potential cause for the loss phenomenon is provided. It is observed that the dielectric loss and copper loss occur near the patch resonance due to strong electric fields in the substrate region below the patch and the large currents on the top surface of the patch, respectively.

引用

页码：1192 / 1196

页数：5

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