Interface roughness in Fe(100)/Cr film structures studied by CEMS

被引：44
|
作者：
Klinkhammer, F [1 ]
Sauer, C [1 ]
Tsymbal, EY [1 ]
Handschuh, S [1 ]
Leng, Q [1 ]
Zinn, W [1 ]
机构：
[1] FORSCHUNGSZENTRUM JULICH, FORSCHUNGSZENTRUM, INST FESTKORPERFORSCH, D-52425 JULICH, GERMANY
来源：
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1996年 / 161卷
关键词：
Mossbauer effect; CEMS; interface roughness; Fe(100)/Cr; layered structures;
D O I：
10.1016/S0304-8853(96)00063-7
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Various epitaxial Fe(100)/Cr film structures were MBE-grown on MgO(100) and GaAs(100) substrates with the aim to modify the roughness of the Fe/Cr interfaces. By introducing a 2 monolayer thick Fe-57 probe layer at the interface the distribution of the magnetic hyperfine (hf) fields could be measured locally by means of Fe-57 conversion electron Mossbauer spectroscopy (GEMS). A simple model is applied which allows the determination of a pattern of the average interface roughness from this hf field distribution. It was observed that even samples of high epitaxial quality according to LEED and RHEED reveal a micro-roughness on a lateral scale of 1-2 nm due to intermixing of Fe and Cr within 1-2 monolayers.
引用
收藏
页码：49 / 56
页数：8
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