Ferromagnetic resonance study of sputtered Pt/Co/Pt multilayers

被引：9

作者：

Neilinger, P. ^{[1
]}

Scepka, T. ^{[2
]}

Mruczkiewicz, M. ^{[2
]}

Derer, J. ^{[2
]}

Manca, D. ^{[1
,3
]}

Dobrocka, E. ^{[2
]}

Samardak, A. S. ^{[4
,5
]}

Grajcar, M. ^{[1
,3
]}

Cambel, V. ^{[2
]}

机构：

[1] Comenius Univ, Dept Expt Phys, Bratislava 84248, Slovakia

[2] SAS, Inst Elect Engn, Dubravska Cesta 9, Bratislava 84104, Slovakia

[3] SAS, Inst Phys, Dubravska Cesta 9, Bratislava 84104, Slovakia

[4] Far Eastern Fed Univ, Sch Nat Sci, Vladivostok 690950, Russia

[5] Natl Res South Ural State Univ, Chelyabinsk 454080, Russia

来源：

APPLIED SURFACE SCIENCE | 2018年 / 461卷

关键词：

Ferromagnetic resonance; g-factor; Gilbert damping; Nano-layers; Surface anisotropy; Co/Pt multilayers; PERPENDICULAR MAGNETIC-ANISOTROPY;

D O I：

10.1016/j.apsusc.2018.06.172

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We report on broadband ferromagnetic resonance studies of [Pt-tPt/Co-tCo/Pt-tPt](N) multilayer thin films, using a flip-chip method with a high frequency coplanar waveguide at room temperature. We investigate the dependence of the magnetic parameters of thin films, namely the Gilbert damping constant alpha, the effective magnetization M-eff and Lande g-factor on both the Pt layer thickness (0.9 nm <= t(Pt) <= 2.7 nm) and the thickness of the Co layers (1.2 nm <= t(Co) <= 11.3 nm). Moreover, the effect of different stacking numbers N on the film parameters is studied.

引用

页码：202 / 205

页数：4

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