Single-molecule analysis by noncontact atomic force microscopy

被引：30
|
作者：
Sasahara, A [1 ]
Uetsuka, H [1 ]
Onishi, H [1 ]
机构：
[1] Kanagawa Acad Sci & Technol, Surface Chem Lab, Takatsu Ku, Kawasaki, Kanagawa 2130012, Japan
来源：
JOURNAL OF PHYSICAL CHEMISTRY B | 2001年 / 105卷 / 01期
关键词：
D O I：
10.1021/jp003045v
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Atomic force microscopy operated in noncontact mode (NC-AFM) is a promising method for high-resolution sensing of a wide range of materials regardless of conductivity. Its feasibility in single-molecule analysis is demonstrated; formate (HCOO-) and acetate (CH3COO-) molecules were identified molecule-by-molecule on a TiO2 substrate. The character of the tip-molecule force responsible for the observed image contrast is discussed.
引用
收藏
页码：1 / 4
页数：4
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