Force modulation atomic force microscopy as a powerful tool in organic-inorganic hybrid materials analysis

被引：0
|
作者：
Schiavon, G
Kuchler, JG
Corain, B
Hiller, W
机构：
[1] Tech Univ Munich, Lehrstuhl Anorgan & Analyt Chem, D-85747 Garching, Germany
[2] Colfirmit Rajasil GMBH, D-95603 Marktredwitz, Germany
[3] Univ Padua, Dipartimento Chim Inorgan Met Organ & Analit, I-35131 Padua, Italy
来源：
ADVANCED MATERIALS | 2001年 / 13卷 / 05期
关键词：
D O I：
10.1002/1521-4095(200103)13:5<310::AID-ADMA310>3.0.CO;2-C
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
The properties of organic-inorganic materials prepared with sol-gel techniques were investigated using force modulation atomic force microscopy (AFM). Films were prepared by dip-coating deposition and were analyzed by AFM force modulation to evaluate the reaction mixture. Force modulation analysis created a map of the relative hardness on the surface of the resulting films to observe the separation of two phases.
引用
收藏
页码：310 / 313
页数：4
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