共 50 条
- [41] High depth resolution SIMS analysis using metal cluster complex ion bombardment PROCEEDINGS OF THE 17TH INTERNATIONAL VACUUM CONGRESS/13TH INTERNATIONAL CONFERENCE ON SURFACE SCIENCE/INTERNATIONAL CONFERENCE ON NANOSCIENCE AND TECHNOLOGY, 2008, 100
- [42] Quantitative Lithiation Depth Profiling in Silicon Containing Anodes Investigated by Ion Beam Analysis BATTERIES-BASEL, 2022, 8 (02):
- [46] Enhanced depth resolution in positron analysis of ion irradiated SiO2 films J Appl Phys, 3 (1765-1770):
- [48] Simultaneous analysis of multiple elements by combined ion-beam methods APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY, 2001, 576 : 447 - 450
- [49] QUANTIFICATION OF HYDROGEN IN SOLIDS BY 2 METHODS OF ION-BEAM ANALYSIS NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3): : 409 - 414