Floating Body Effect in Partially Depleted Silicon Nanowire Transistors and Potential Capacitor-Less One-Transistor DRAM Applications

被引:13
|
作者
Lee, Myeongwon [1 ]
Moon, Taeho [1 ]
Kim, Sangsig [1 ]
机构
[1] Korea Univ, Dept Elect Engn, Seoul 136713, South Korea
基金
新加坡国家研究基金会;
关键词
Capacitor-less; floating body effect; partially depleted (PD); silicon nanowire transistor (SNWT); 1T-DRAM;
D O I
10.1109/TNANO.2011.2175942
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present a capacitor-less 1T-DRAM cell on SiO2/Si substrates using a silicon nanowire (SiNW) as the channel material. The SiNWs are fabricated by a top-down route that is fully compatible with the current Si-based CMOS technology. Based on the observation of the floating body effect of a partially depleted (PD) silicon nanowire transistor (SNWT), its 1T-DRAM functionality and reliability characteristics are investigated. By virtue of the top-down route providing a printable form of the inverted triangular SiNWs, the PD SNWT 1T-DRAM cell can be applied on insulating plastic substrates for potential applications of flexible electronics.
引用
收藏
页码:355 / 359
页数:5
相关论文
共 23 条
  • [11] A Novel One-Transistor Dynamic Random-Access Memory (1T DRAM) Featuring Partially Inserted Wide-Bandgap Double Barriers for High-Temperature Applications
    Kim, Myeongsun
    Ha, Jongmin
    Kwon, Ikhyeon
    Han, Jae-Hee
    Cho, Seongjae
    Cho, Il Hwan
    MICROMACHINES, 2018, 9 (11)
  • [12] Silicon-on-Ferroelectric Insulator field effect transistor (SOFFET): Partially depleted structure for sub-60 mV/decade applications
    Es-Sakhi, Azzedin D.
    Chowdhury, Masud H.
    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2015, 39 : 596 - 605
  • [13] Gate direct-tunnelling and hot-carrier-induced hysteresis effect in partially depleted silicon-on-insulator floating-body MOSFETs
    Zhou, Jianhua
    Pang, Albert
    Zou, Shichang
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2011, 44 (07)
  • [14] Modeling of floating-body effect in silicon-on-insulator metal - oxide - silicon field-effect transistor with complete surface-potential-based description
    Murakami, Takahiro
    Ando, Makoto
    Sadachika, Norio
    Yoshida, Takaki
    Miura-Mattausch, Mitiko
    Japanese Journal of Applied Physics, 2008, 47 (4 PART 2): : 2556 - 2559
  • [15] Excellent scalability including self-heating phenomena of vertical-channel field-effect-diode type capacitor-less one transistor dynamic random access memory cell
    Imamoto, Takuya
    Endoh, Tetsuo
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2014, 53 (04)
  • [16] Modeling of floating-body effect in silicon-on-insulator metal-oxide-silicon field-effect transistor with complete surface-potential-based description
    Murakami, Takahiro
    Ando, Makoto
    Sadachika, Norio
    Yoshid, Takaki
    Miura-Mattausch, Mitiko
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2008, 47 (04) : 2556 - 2559
  • [17] Suppression of floating body effects by controlling potential profile in the lower body region of silicon-on-insulator metal-oxide-semiconductor field effect transistors
    Sato, Yasuhiro
    Tsuchiya, Toshiaki
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2000, 39 (6 A): : 3271 - 3276
  • [18] Suppression of floating body effects by controlling potential profile in the lower body region of silicon-on-insulator metal-oxide-semiconductor field effect transistors
    Sato, Y
    Tsuchiya, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2000, 39 (6A): : 3271 - 3276
  • [19] Investigation on the fully- and partially-depleted thin-film silicon-on-insulator power metal-oxide-semiconductor field-effect-transistors for high-frequency applications
    Matsumoto, S
    Sakai, T
    Yachi, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (11): : 6115 - 6118
  • [20] Investigation on the fully- and partially-depleted thin-film silicon-on-insulator power metal-oxide-semiconductor field-effect-transistors for high-frequency applications
    Matsumoto, Satoshi
    Sakai, Tatsuo
    Yachi, Toshiaki
    1600, JJAP, Tokyo (39):