Overview of surfactant applications in semiconductor manufacturing.

被引:0
|
作者
Hurd, T [1 ]
Solomentsev, Y [1 ]
Siddiqui, S [1 ]
Matz, P [1 ]
Riley, D [1 ]
Hall, L [1 ]
Misra, A [1 ]
Fisher, M [1 ]
机构
[1] Texas Instruments Inc, Dallas, TX 75243 USA
关键词
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
316-COLL
引用
收藏
页码:U398 / U399
页数:2
相关论文
共 50 条
  • [1] Laser chemical process for clean applications in semiconductor manufacturing.
    Yogev, D
    Engel, M
    Zeid, S
    Barzilay, I
    Livshits, B
    LASER APPLICATIONS IN MICROELECTRONIC AND OPTOELECTRONIC MANUFACTURING V, 2000, 3933 : 77 - 88
  • [2] POLYIMIDES IN SEMICONDUCTOR MANUFACTURING.
    Iscoff, Ron
    Semiconductor International, 1984, 7 (10) : 116 - 119
  • [3] WATER PURIFICATION CRITERIA FOR SEMICONDUCTOR MANUFACTURING.
    Iscoff, Ron
    1600, (08):
  • [4] AN OVERVIEW OF ADHESIVES USED IN ELECTRONIC MANUFACTURING.
    Lilly, Ron
    Electron Manuf, 1988, 34 (07): : 23 - 25
  • [5] CLEAN DRY AIR SYSTEMS IN SEMICONDUCTOR MANUFACTURING.
    Murphy, Edward J.
    1984, (02):
  • [6] DEVELOPMENT OF SMALL SOR SYSTEMS AND APPLICATION TO SEMICONDUCTOR MANUFACTURING.
    Tomimasu, Takio
    JEE. Journal of electronic engineering, 1986, 23 (234): : 72 - 79
  • [7] KNOWLEDGE-BASED PROCESS DIAGNOSIS SYSTEM FOR SEMICONDUCTOR MANUFACTURING.
    Kurihara, Kenzou
    Akashi, Kichizou
    Meguro, Satoshi
    Hitachi Review, 1986, 35 (01): : 5 - 8
  • [8] Polymer materials and processing methods for environmentally friendly semiconductor manufacturing.
    Pham, VQ
    Felix, N
    Jakubek, V
    Mao, Y
    Gleason, KK
    Ober, CK
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2004, 227 : U449 - U449
  • [9] Quality and exposure control in semiconductor manufacturing. Part I: Modelling
    Bettayeb, Belgacem
    Bassetto, Samuel
    Vialletelle, Philippe
    Tollenaere, Michel
    INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, 2012, 50 (23) : 6835 - 6851
  • [10] Quality and exposure control in semiconductor manufacturing. Part II: Evaluation
    Bettayeb, Belgacem
    Bassetto, Samuel
    Vialletelle, Philippe
    Tollenaere, Michel
    INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, 2012, 50 (23) : 6852 - 6869