A simple method to determine the optical constants and thicknesses of ZnxCd1-xS thin films

被引:42
|
作者
Torres, J
Cisneros, JI
Gordillo, G
Alvarez, F
机构
[1] UNIV NACL COLOMBIA, DEPT FIS, SANTA FE DE BOGOTA, COLOMBIA
[2] UNICAMP, INST FIS GLEB WATAGHIN, BR-13083970 CAMPINAS, BRAZIL
关键词
cadmium sulphide; evaporation; inorganic compounds; optical properties; optical spectroscopy; semiconductors; solar cells; sulfides; vacancies;
D O I
10.1016/S0040-6090(96)08931-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A new method to determine the optical parameters of ZnxCd1-xS polycrystalline thin films is proposed. Sub-gap absorption, caused by acceptor states, is taken into account in the determination of the refractive index and film thickness. This procedure avoids errors in the results, frequently observed when the absorption is ignored. In the low and medium absorption region the refractive index is parametrized by the Wemple and DiDomenico (W-D) single oscillator model. The W-D parameters are further used in order to extrapolate the refractive index at the absorption edge to compute the absorption coefficient and the optical gap. The transmission spectra of typical CdS, (Zn,Cd)S and ZnS thin films and their corresponding values of n, alpha and E(g) are presented.
引用
收藏
页码:238 / 241
页数:4
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