Low Cost Rollback to Improve Fault-Tolerance in VLSI Circuits

被引:0
|
作者
Bonnoit, Thierry [1 ,2 ]
Zergainoh, Nacer-Eddine
Nicolaidis, Michael
Velazco, Raoul
机构
[1] Univ Grenoble Alpes, TIMA, F-38000 Grenoble, France
[2] CNRS, TIMA, F-38000 Grenoble, France
关键词
Error correction; fault tolerance; soft error; rollback; LOGIC;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In nanometer technologies, circuits are more and more sensitive to various kinds of perturbations. Alpha particles and atmospheric neutrons are affecting storage elements as well as the combinational logic. In the past, the major efforts were related on memories. However, as the whole situation is getting worse, solutions that protect the entire design are mandatory. Solutions for detecting the error in logic functions already exist, but there are only few of them that allow the correction, leading to a lot of hardware overhead in non-processor design. In this paper, we present a novel hardware architecture that reduces the cost of rollback in any kinds of circuit.
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页数:4
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