The effect of annealing under hydrostatic pressure on the visible photoluminescence from Si+-ion implanted SiO2 films

被引:12
|
作者
Tyschenko, IE [1 ]
Rebohle, L
Yankov, RA
Skorupa, W
Misiuk, A
Kachurin, GA
机构
[1] Russian Acad Sci, Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, Russia
[2] Rossendorf Inc, Forschungszentrum Rossendorf EV, Inst Ionenstrahlphys & Mat Forsch, D-01314 Dresden, Germany
[3] Inst Electron Technol, PL-02668 Warsaw, Poland
关键词
ion implantation; nanocluster; visible photoluminescence; silicon dioxide; hydrostatic pressure;
D O I
10.1016/S0022-2313(98)00103-3
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We have studied the influence of the hydrostatic pressure during annealing on the intensity of the visible photoluminescence (PL) from thermally grown SiO2 films irradiated with Si (+) ions. Post-implantation anneals have been carried out in an Ar ambient at temperatures T-a of 400 degrees C and 450 degrees C for 10 h and 1130 degrees C for 5 h at hydrostatic pressures of I bar-15 kbar. It has been found that the intensity of the 360, 460 and 600 nm PL peaks increases with rising hydrostatic pressure during low-temperature annealing. The intensity of the short-wavelength PL under conditions of hydrostatic pressure continues to rise even at T-a = 1130 degrees C. Increasing T-a leads to a shift in the PL spectra towards the ultraviolet range. The results obtained have been interpreted in terms of enhanced, pressure-mediated formation of =Si-Si= centres and small Si clusters within metastable regions of the ion-implanted SiO2. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:229 / 233
页数:5
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