Measure of the Optical and Electrical Properties of Semiconductor SiO2 Nano-crystalline by Using Photo-acoustic Technology

By using a new type of single-beam normalized photo-acoustic spectroscopy that with weak signal detection and non-invasive testing, the photo-acoustic spectroscopy of semiconductor SiO2 nano-crystals was measured, the measured spectra of semiconductor SiO2 nano-crystals absorption coefficient was 0.20, and powders band gap is 3.4eV. The TEM image shows that the semiconductor SiO2 nano-crystals are round lump structure, while the grain size of the semiconductor SiO2 nano-crystals is about 70x200 nm, and the average particle size after the reunion is 100x300 nm. Compared with their micron crystal, the optical and electrical properties of semiconductor nano-crystals and nano-particle size are closely related. By changing the size of semiconductor nano-crystals, the mix could achieve the goal of changing the optical and electrical properties. Because of the semiconductor SiO2 nano-crystals' special properties of optics and electronics and photo-semiconductor nano-materials, they are widely used in many areas of modern science and technology.