Fixed wavelength selection for the far-infrared p-Ge laser using thin silicon intracavity etalon

被引:1
|
作者
Du Bosq, TW [1 ]
Peale, RE [1 ]
Nelson, EW [1 ]
Muravjov, AV [1 ]
Fredricksen, CJ [1 ]
机构
[1] Univ Cent Florida, Dept Phys, Orlando, FL 32816 USA
来源
SOLID STATE LASERS XII | 2003年 / 4968卷
关键词
far-infrared; terahertz; sub-millimeter; p-germanium; semiconductor laser; tunable laser;
D O I
10.1117/12.478952
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A thin two-side polished silicon etalon is demonstrated as a fixed-wavelength intracavity selector for the far-infrared p-Ge laser. The active cavity finesse is similar to0.1. The wavelength position and spectral purity are maintained over a wide range of laser operating fields. A p-Ge laser with such a selector may find application in chemical sensing, THz imaging, or non-destructive testing.
引用
收藏
页码:18 / 23
页数:6
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