Integral equation modeling of electrostatic interactions in atomic force microscopy

被引：0
|
作者：
Shen, Y. [1 ]
Barnett, D. M. [1 ]
Pinsky, P. M. [1 ]
机构：
[1] Stanford Univ, Stanford, CA 94305 USA
来源：
INTEGRAL METHODS IN SCIENCE AND ENGINEERING: TECHNIQUES AND APPLICATIONS | 2008年
关键词：
D O I：
10.1007/978-0-8176-4671-4_27
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：237 / 246
页数：10
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