Microwave Dielectric Properties of La(Mg0.5-xZnxSn0.5)O3 Ceramics

被引：3
|
作者：
Chen, Kuei-Chien [1 ]
Chen, Yih-Chien [1 ]
Yao, Shi-Li [1 ]
机构：
[1] Lunghwa Univ Sci & Technol, Dept Elect Engn, Gueishan Shiang, Taoyuan County, Taiwan
来源：
FERROELECTRICS LETTERS SECTION | 2011年 / 38卷 / 4-6期
关键词：
La(Mg0.5-xZnxSn0.5)O-3; X-ray diffraction pattern; Dielectric constant Quality factor; Temperature coefficient of resonant frequency; SINTERING TEMPERATURE; CUO ADDITIONS;
D O I：
10.1080/07315171.2011.623608
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
The microwave dielectric properties of La(Mg0.5-xZnxSn0.5)O-3 ceramics were examined with a view to their exploitation for mobile communication. The La(Mg0.5-xZnxSn0.5)O-3 ceramics were prepared by the conventional solid-state method with various sintering temperatures. The X-ray diffraction patterns of the La(Mg0.45Zn0.05Sn0.5)O-3 ceramics revealed La(Mg0.45Zn0.05Sn0.5)O-3 is the main crystalline phase, which is accompanied by small amounts of La2Sn2O7 as the second phases. Apparent density of 6.59 g/cm(3), dielectric constant (epsilon(r)) of 19.82 and quality factor (Q x f) of 41,600 GHz were obtained for La(Mg0.49Zn0.01Sn0.5)O-3 ceramics that were sintered at 1550 degrees C for 4 h.
引用
收藏
页码：101 / 107
页数：7
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