High-resolution monochromatic x-ray imaging system based on spherically bent crystals

被引：94

作者：

Aglitskiy, Y ^{[1
]}

Lehecka, T

Obenschain, S

Bodner, S

Pawley, C

Gerber, K

Sethian, J

Brown, CM

Seely, J

Feldman, U

Holland, G

机构：

[1] Sci Applicat Int Corp, Mclean, VA 22102 USA

[2] USN, Res Lab, Div Plasma Phys, Washington, DC 20375 USA

[3] USN, Res Lab, Div Space Sci, Washington, DC 20375 USA

[4] SFA Inc, Landover, MD 20785 USA

来源：

APPLIED OPTICS | 1998年 / 37卷 / 22期

关键词：

D O I：

10.1364/AO.37.005253

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We have developed an improved x-ray imaging system based on spherically curved crystals. It is designed and used for diagnostics of targets ablatively accelerated by the Nike KrF laser. A spherically curved quartz crystal (2d = 6.687 Angstrom, R = 200 mm) has been used to produce monochromatic backlit images with the He-like Si resonance line (1865 eV) as the source of radiation. The spatial resolution of the x-ray optical system is 1.7 mu m in selected places and 2-3 mu m over a larger area. Time-resolved backlit monochromatic images of polystyrene planar targets driven by the Nike facility have been obtained with a spatial resolution of 2.5 mu m in selected places and 5 mu m over the focal spot of the Nike laser. (C) 1998 Optical Society of America.

引用

页码：5253 / 5261

页数：9

共 50 条

[31] Accurate X-ray source dimension measurement by the spherically bent crystal imaging system
Shen, Jin
Zhang, Weiquan
Zan, Guibin
Xu, Zhanglang
Du, Xuewei
Wang, Qiuping
ELEVENTH INTERNATIONAL CONFERENCE ON INFORMATION OPTICS AND PHOTONICS (CIOP 2019), 2019, 11209
[32] Design And Implementation of High-Resolution X-ray Digital Imaging System
Xiao Han
Cheng Jinghai
ELECTRONIC INFORMATION AND ELECTRICAL ENGINEERING, 2012, 19 : 505 - 507
[33] HIGH-RESOLUTION X-RAY SPECTROMETER BASED ON A CYLINDRICALLY BENT CRYSTAL IN NONDISPERSIVE GEOMETRY
HAMALAINEN, K
KRISCH, M
KAO, CC
CALIEBE, W
HASTINGS, JB
REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (02): : 1525 - 1527
[34] High-resolution x-ray spectrometer based on a cylindrically bent crystal in nondispersive geometry
Rev Sci Instrum, 2 pt 2 (1525):
[35] Simple, compact, high-resolution monochromatic x-ray source for characterization of x-ray calorimeter arrays
Leutenegger, M. A.
Eckart, M. E.
Moseley, S. J.
Rohrbach, S. O.
Black, J. K.
Chiao, M. P.
Kelley, R. L.
Kilbourne, C. A.
Porter, F. S.
REVIEW OF SCIENTIFIC INSTRUMENTS, 2020, 91 (08):
[36] Double-spherically bent crystal scheme of stigmatic x ray monochromatic backlit imaging
Wang, Ruirong
An, Honghai
Xie, Zhiyong
Fang, Zhiheng
Wang, W. E., I
OPTICS LETTERS, 2022, 47 (21) : 5469 - 5472
[37] Spherically bent crystal for X-ray imaging of laser produced plasmas
Morace, A.
Batani, D.
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2010, 623 (02): : 797 - 800
[38] High-resolution x-ray characterization of mosaic crystals for hard x-ray astronomy
Ferrari, Claudio
Buffagni, Elisa
Marchini, Laura
Zappettini, Andrea
OPTICAL ENGINEERING, 2012, 51 (04)
[39] A spherically bent crystal analyzer for X-ray backlighting imaging diagnosis
Liu, Li-Feng
Xiao, Sha-Li
Qian, Jia-Yu
Guangdianzi Jiguang/Journal of Optoelectronics Laser, 2015, 26 (03): : 439 - 443
[40] Application of spherically bent crystal to X-ray backlight imaging experiment
Liu L.-F.
Xiao S.-L.
Wu Y.-F.
Qian J.-Y.
Wei M.-X.
Chen B.-L.
Guangxue Jingmi Gongcheng/Optics and Precision Engineering, 2011, 19 (09): : 2023 - 2028

← 1 2 3 4 5 →