In-Situ Investigation on Selenization Pathways of Bilayer Stacked Cu-Zn-Sn Metal Precursors Designed for Reduced Sn Loss

被引:0
|
作者
Han, Jaesung [1 ]
Koo, Jaseok [1 ]
Kim, Woo Kyoung [1 ]
机构
[1] Yeungnam Univ, Sch Chem Engn, Gyongsan 38541, Gyeongbuk, South Korea
基金
新加坡国家研究基金会;
关键词
Cu2ZnSnSe4; Sn Loss; Cu-Zn-Sn Metal Precursors; High-Temperature XRD; Reaction Pathways; CU2ZNSNS4;
D O I
10.1166/sam.2018.3083
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Bilayer Cu-Zn-Sn precursors, i.e., Mo/Zn/(Cu + Sn), and Mo/Sn/(Cu + Zn), were prepared using the simultaneous and sequential sputtering of pure Cu, Sn and Zn targets. Their phase evolutions during subsequent selenization were examined by in-situ high-temperature X-ray diffraction (XRD). Both XRD and Raman scattering techniques were used to confirm the formation of quaternary Cu2ZnSnSe4 (CZTSe). The results showed that the Mo/Sn/(Cu + Zn) precursors were transformed completely to CZTSe at approximately 375 degrees C and higher, whereas the complete transformation of the Mo/Zn/(Cu + Sn) precursor required higher temperatures (400-450 degrees C). Furthermore, the precursor structure with co-sputtered Cu and Sn elements was preferred to prevent severe Sn loss during CZTSe formation at and above 450 degrees C.
引用
收藏
页码:603 / 609
页数:7
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