Data storage in ferroelectrical films by near-field optical probe

被引：0
|
作者：
Xu, YC
Pelzl, J
机构：
来源：
ISE 9 - 9TH INTERNATIONAL SYMPOSIUM ON ELECTRETS, PROCEEDINGS | 1996年
关键词：
D O I：
10.1109/ISE.1996.578111
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper, we suggest that a near-field optical probe be used to store data in ferroelectrical films. Near-field optical probe has light focusing effect, the focused spot is as small as subnanometer scale depending on the apex size of the probe. It is no limited by the diffraction principle any more. The data storage rate increases at least 20 times than the conventional case. This is just near the scale of the smallest ferroelectrical domain in the films.
引用
收藏
页码：397 / 400
页数：4
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