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- [2] Assembly and Reliability Challenges in 3D Integration of 28nm FPGA Die on a Large High Density 65nm Passive Interposer 2012 IEEE 62ND ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2012, : 279 - 283
- [3] Enabling 3D-IC foundry technologies for 28 nm node and beyond: through-silicon-via integration with high throughput die-to-wafer stacking 2009 IEEE INTERNATIONAL ELECTRON DEVICES MEETING, 2009, : 327 - 330
- [4] High-Performance, Cost-Effective Heterogeneous 3D FPGA Architectures GLSVLSI 2009: PROCEEDINGS OF THE 2009 GREAT LAKES SYMPOSIUM ON VLSI, 2009, : 251 - 256
- [5] 28nm High-K Metal Gate Heterogeneous Quad-core CPUs for High-performance and Energy-efficient Mobile Application Processor 2013 INTERNATIONAL SOC DESIGN CONFERENCE (ISOCC), 2013, : 198 - 201
- [6] 28nm High-κ Metal-Gate Heterogeneous Quad-Core CPUs for High-Performance and Energy-Efficient Mobile Application Processor 2013 IEEE INTERNATIONAL SOLID-STATE CIRCUITS CONFERENCE DIGEST OF TECHNICAL PAPERS (ISSCC), 2013, 56 : 154 - U957
- [7] A larger stacked layer number scalable TSV-based 3D-SRAM for high-performance universal-memory-capacity 3D-IC platforms IEEE Symp VLSI Circuits Dig Tech Pap, 2011, (74-75):
- [8] A 14nm Finfet Transistor-Level 3D Partitioning Design to Enable High-Performance and Low-Cost Monolithic 3D IC 2016 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), 2016,