Nonlinear Pixel Non-Uniformity: Emulation and Correction

被引:1
|
作者
Haefner, David P. [1 ]
机构
[1] CCDC C5ISR Ctr, Night Vis & Elect Sensors Directorate, FCDD ISN MM, 10221 Burbeck Rd, Ft Belvoir, VA 22060 USA
关键词
Non-uniformity correction; Fixed pattern noise; System characterization;
D O I
10.1117/12.2518110
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
All infrared focal plane array (FPA) sensors suffer from spatial non-uniformity or fixed-pattern noise (FPN). The severity of the FPN depends on the underlying manufacturing materials, methods, and tolerances, and can greatly affect overall imager performance. A key part of sensor characterization is the ability to map a known input radiance to an observed output digital count value. The presence of FPN requires a per-pixel response to be measured and specified. With this forward model defined, the inverse can be used to correct the spatial variation and ensure FPN does not corrupt other measurement estimates. In general, both the forward and inverse models are nonlinear in nature and require special care to ensure correct implementation. In this correspondence we outline a least squares emulation and correction estimation method for linear and nonlinear correction terms. We discuss the tradeoffs between computational complexity for different non-linear functions and the potential gains in reduction of fixed pattern noise. The algorithms utilize centering and scaling to improve numerical stability and is computationally efficient. In support of the reproducible research effort, the Matlab functions associated with this work can be found on the Mathworks file exchange [1].
引用
收藏
页数:13
相关论文
共 50 条
  • [41] Non-uniformity correction and calibration of a portable infrared scene projector
    Kelly, TH
    2002 IEEE AUTOTESTCON PROCEEEDINGS, SYSTEMS READINESS TECHNOLOGY CONFERENCE, 2002, : 107 - 115
  • [42] Kernel Regression Based Infrared Image Non-uniformity Correction
    Wu, Jinsha
    Qin, Hanlin
    Liang, Ying
    Zhou, Huixin
    Zeng, Qingjie
    Qian, Runda
    AOPC 2017: OPTICAL SENSING AND IMAGING TECHNOLOGY AND APPLICATIONS, 2017, 10462
  • [43] Non-uniformity correction algorithm based on improved neural network
    Zhang Xin
    Li Huan
    Hou Juntao
    Zhao Dong
    Zhou Huixin
    Zhang Jiajia
    Zhang Zhe
    Cheng Kuanhong
    SEVENTH SYMPOSIUM ON NOVEL PHOTOELECTRONIC DETECTION TECHNOLOGY AND APPLICATIONS, 2021, 11763
  • [44] Single image non-uniformity correction using compressive sensing
    Jian Xian-zhong
    Lu Rui-zhi
    Guo Qiang
    Wang Gui-pu
    INFRARED PHYSICS & TECHNOLOGY, 2016, 76 : 360 - 364
  • [45] A curvature filter and PDE based non-uniformity correction algorithm
    Cheng, Kuanhong
    Zhou, Huixin
    Qin, Hanlin
    Zhao, Dong
    Qian, Kun
    Rong, Shenghui
    Yin, Shimin
    INFRARED TECHNOLOGY AND APPLICATIONS, AND ROBOT SENSING AND ADVANCED CONTROL, 2016, 10157
  • [46] Improving performance of LMS non-uniformity correction by sigma filter
    Liang, Chaobing
    Sang, Hongshi
    MIPPR 2013: MULTISPECTRAL IMAGE ACQUISITION, PROCESSING, AND ANALYSIS, 2013, 8917
  • [47] Improved MWIR Reference Sources for FPA Non-Uniformity Correction
    Crosbie, Michael J.
    Gordon, Neil T.
    Hall, David J.
    Hails, Janet E.
    Little, Christopher J.
    Ashley, Stuart
    Axcell, Christopher
    INFRARED TECHNOLOGY AND APPLICATIONS XXXVI, PTS 1 AND 2, 2010, 7660
  • [48] Non-uniformity correction of key device ICCD in ultraviolet imager
    Wang, Jia-Peng
    Wang, Shu-Rong
    Li, Fu-Tian
    Song, Ke-Fei
    Guangxue Jingmi Gongcheng/Optics and Precision Engineering, 2007, 15 (09): : 1353 - 1360
  • [49] Non-uniformity correction of a resistor array infrared scene projector
    Olson, EM
    Murrer, RL
    TECHNOLOGIES FOR SYNTHETIC ENVIRONMENTS: HARDWARE-IN-THE-LOOP TESTING IV, 1999, 3697 : 403 - 413
  • [50] Thermopile detectors: spatial non-uniformity measurements and correction methods
    Lin, YD
    Stock, KD
    METROLOGIA, 2000, 37 (05) : 481 - 484