Deformation of silicon surfaces

被引:2
|
作者
Lambropoulos, JC
Chen, KH
Lambropoulos, TJ
机构
[1] Univ Rochester, Dept Mech Engn, Rochester, NY 14627 USA
[2] Univ Rochester, Mat Sci Program, Rochester, NY 14627 USA
[3] Univ Rochester, Laser Energet Lab, Rochester, NY 14627 USA
[4] Univ Rochester, Ctr Opt Mfg, Rochester, NY 14627 USA
[5] Pittsford Mendon High Sch, Pittsford, NY 14534 USA
关键词
silicon; stiffness; compliance; phase transition; stresses; residual forces; Reuss; Voigt;
D O I
10.1117/12.506332
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Processing of semiconductors, including machining, grinding, or polishing, involves thermomechanical deformation of a thin surface layer, thus coupling temperature and stress fields. Si, Ge, and other Ill-V semiconductors, exhibit complex constitutive laws coupling mechanical deformation with an evolving microstructure, typically dislocation density or coordination number. Irreversible shear flow and phase transitions are induced by combined stresses and temperatures. We discuss constitutive laws applicable to the machining of silicon.
引用
收藏
页码:203 / 214
页数:12
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