SINGLE EVENT TRANSIENTS' INVESTIGATION IN MODERN FPGA CIRCUITS

被引：0
|
作者：
Sorokoumov, G. S. [1 ]
Bobrovskiy, D. V. [1 ]
Chumakov, A. I. [1 ]
机构：
[1] Natl Res Nucl Univ MEPhI, Specialized Elect Syst SPELS, Moscow, Russia
来源：
RAD 2015: THE THIRD INTERNATIONAL CONFERENCE ON RADIATION AND APPLICATIONS IN VARIOUS FIELDS OF RESEARCH | 2015年
关键词：
heavy ions; laser; SET; SEE; TMR; chain of inverters; FPGA; RADIATION;
D O I：
暂无
中图分类号：
TL [原子能技术]; O571 [原子核物理学];
学科分类号：
0827 ; 082701 ;
摘要：
Experimental results of single event transients in FPGA under ion and focused laser beam irradiation are presented. Abnormal time duration of single event transients in FPGA under ion beam was observed.
引用
收藏
页码：423 / 426
页数：4
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