Error analysis in two-terminal impedance measurements with residual correction

被引:6
|
作者
Torrents, JM [1 ]
Pallàs-Areny, R [1 ]
机构
[1] Univ Politecn Cataluna, Tec Sch Castelldefels, EPSC, Dept Elect Engn, ES-08034 Barcelona, Spain
关键词
error analysis; impedance measurements; residual correction;
D O I
10.1109/TIM.2005.853671
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Residual impedance correction in impedance analyzers when using an asymmetrical test fixture needs three reference measurements, usually open circuit, short circuit, and load (meaning an impedance close to the impedance under test). This paper provides an error estimate for impedance measurements that apply a simple open/short correction in spite of using an asymmetrical test fixture. Experimental results show that the minimal error is obtained for impedance values close to the geometric mean of the short-circuit and open-circuit impedances, and that the theoretical prediction is indeed an upper limit for the actual error.
引用
收藏
页码:2113 / 2116
页数:4
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